Ion-tof公司
Web22 dec. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … Web26 dec. 2009 · 本文简要叙述法国cameca 公司,德国ion tof gmbh 公司新型的nano sims50ims wf ims sc uitra tof sims iv 型二次离子质谱的特色,着重介绍这些仪器改进过的和新增加的 …
Ion-tof公司
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Web29 mrt. 2024 · IONTOF: TOF-SIMS products for time of flight secondary ion mass spectrometry and LEIS products low energy ion scattering and ion scattering … The M6 Plus - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... SurfaceLab 7 - IONTOF - TOF-SIMS (time of flight secondary ion mass … The basic instrument is equipped with a reflectron TOF analyser giving high … Low Energy Ion Scattering - IONTOF - TOF-SIMS (time of flight secondary ion … With the Q Exactive TM extension for the M6, IONTOF provides the first … Service - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Sales - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... Applications - IONTOF - TOF-SIMS (time of flight secondary ion mass spectrometry ... WebION-TOF公司创建于1989年,是专门研究和生产飞行时间二次离子质谱仪器(TOF-SIMS)的高科技公司。 其创始人贝宁豪文(Beninghoven)教授是静态二次离子质谱的奠基人,创建 …
Web24 mrt. 2024 · Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the … Web为了进一步简化谱图数据处理,IONTOF 为 M6 提供了各种工具,例如质谱图库,完全集成的多元统计分析(MVSA)软件包,以及强大性能的 Q ExactiveTM 功能扩展。 M6 TOF …
http://www.iontof.com.cn/bk_16938892.html WebThe TOF.SIMS 5 is the latest generation of high-end TOF-SIMS instruments developed by IONTOF Company. Its design guarantees optimum performance in all fields of SIMS applications. The instruments offers three ion sources offering Bi1–7+, Cs+ and O2+ and is equipped with a reflectron TOF analyzer giving high secondary ion transmission with ...
WebZ-Gap MCP Microchannel Plate Detectors are available with 18mm, 25mm or 40mm Microchannel Plates. Note: Z-Gap detectors cannot be used to detect negative ions or electrons. Jordan TOF Products, Inc. 990 Golden Gate Terrace Grass Valley, CA 95945 Phone: 530-272-4580 E-mail: [email protected]
WebUltra-high transmission for optimized molecular sensitivity and monolayer analysis High speed (> 8 kHz) TOF-SIMS (MS 1) and tandem MS (MS 2) imaging High resolution (< 100 nm) TOF-SIMS (MS 1) and tandem MS … noun of enforceWebAbout IONTOF GmbH: IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometry … noun of enterWeb北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理,成立于2012年。 公司成员来自北京大学、中科院物理所等一流院校研究生。 主要负责中国大陆及港澳地区的销售、 … noun of entertainWeb3 jul. 2012 · 艾飞拓公司简介. 北京艾飞拓科技有限公司作为德国ION-TOF公司的中国总代理,成立于2012年。. 公司成员来自北京大学、中科院物理所等一流院校研究生。. 主要负 … noun of enormousWeb德国ion tof公司是目前国际tof-sims仪器主要生产商。 2003年,德国ion tof公司研发了第五代tof-sims仪器。 2005年,德国ion tof公司推出第一代bi源。 2010年,德国ion tof公司 … noun of enviousWebIONTOF GmbH 622 volgers op LinkedIn. Advanced Ion Beam Technology for Surface Analysis. Innovative Ion Beam Technology for Surface Analysis IONTOF is a manufacturer of innovative instruments for surface analysis with different product lines for time-of-flight secondary ion mass spectrometers (TOF-SIMS) and high-sensitivity low-energy ion … noun of ensureWebToF-SIMS is an imaging mass spectrometry (MS) technique that allows us to obtain isotopic, elemental, and molecular information from the surface of solid samples. A pulsed, … noun of genuine